A measurement system for the current–voltage characterization of solar cells has been developed. The instrument is based on an Intel 8088 microprocessor, which allows for enhanced data collection and storage, as well as automated measurement control. A high‐power analog supply makes measurements in the range of −10 to +10 V and −0.75 to 0.75 A possible, and provides the capability for sinking currents up to 1 A at +10‐V output. Measured data may be transferred to an IBM personal computer for immediate display, and for consequent analysis (to obtain the characteristic parameters). The system provides a rapid, effectiveI–Vcurve measurement and analysis method for many devices, and experimental solar cells in particular.