Self-adjustment of misfit dislocations in compositionally graded Si1−xGexlayers
作者:
S.Yu. Shiryaev,
期刊:
Philosophical Magazine Letters
(Taylor Available online 1993)
卷期:
Volume 68,
issue 4
页码: 195-200
ISSN:0950-0839
年代: 1993
DOI:10.1080/09500839308242412
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
A model is developed which predicts an ordering of the dislocation multiplication sources in Si1−xGex/Si heteroepitaxial systems. This ordering results in an increased probability for threading dislocations to annihilate. It is shown that, following certain selection rules for dislocation multiplication, an infinite three-dimensional network of misfit dislocations can develop throughout the compositionally graded Si1−xGexlayer. The model is consistent with existing experimental data.
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