Simple device for measuring the two‐way shape memory effect
作者:
Z. Talmi,
M. Ganor,
J. Baram,
J. Pelleg,
期刊:
Review of Scientific Instruments
(AIP Available online 1984)
卷期:
Volume 55,
issue 1
页码: 114-115
ISSN:0034-6748
年代: 1984
DOI:10.1063/1.1137582
出版商: AIP
数据来源: AIP
摘要:
A simple device has been designed to measure continuously and reproducibly the amount of the shape recovery related to the two‐way shape memory effect in specimens undergoing thermal cycling. Using this device, it is possible to follow the dimensional changes of the specimens, to record the exact temperatures where shape changes occur, and to evaluate the amount of hysteresis involved with the shape recovery phenomenon.
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