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Simple device for measuring the two‐way shape memory effect

 

作者: Z. Talmi,   M. Ganor,   J. Baram,   J. Pelleg,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1984)
卷期: Volume 55, issue 1  

页码: 114-115

 

ISSN:0034-6748

 

年代: 1984

 

DOI:10.1063/1.1137582

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple device has been designed to measure continuously and reproducibly the amount of the shape recovery related to the two‐way shape memory effect in specimens undergoing thermal cycling. Using this device, it is possible to follow the dimensional changes of the specimens, to record the exact temperatures where shape changes occur, and to evaluate the amount of hysteresis involved with the shape recovery phenomenon.

 

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