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Simultaneous mass and temperature determination using a single quartz wafer: An optimized crystal cut

 

作者: E. C. van Ballegooijen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1979)
卷期: Volume 50, issue 1  

页码: 91-101

 

ISSN:0021-8979

 

年代: 1979

 

DOI:10.1063/1.325623

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Recently we have reported a method to measure mass and temperature simultaneously using a single rotatedY‐cut quartz crystal coated with a pair of electrodes and a tab. In this paper we will discuss some modifications by which the performance of the method may be strongly improved. A first improvement is achieved by choosing a particular crystal cut (yxl, −20°<&fgr;<20°), and a second improvement is achieved by the introduction of a small gap between the front electrode and the tab. We will present an analysis of the errors in the determination of mass and temperature, which may result from calibration and experimental errors, as a function of the crystal cut and the thickness of the crystal. The results from this analysis are compared with experimental results for three different crystal cuts (yxl, &fgr;=−15°, 0°, +15°). We found that in the presence of a temperature change of 0.1 °C, a mass change of 5 A˚ (copper) could be measured with an accuracy of 3%, while in the presence of a mass change of 500 A˚ (copper) a temperature change of 0.005 °C could be measured within 11.3%. Some suggestions are given to increase the relatively small mass range, i.e., 3000 A˚ (copper), of the method.

 

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