There are two types of crystal edges in the electron micrographs of oxide replicas of metals. The first type is characterized by the edges being more transparent than the facets in reprinted crystals. In the second type of reprinted crystal there were found the opaque edges of crystal. These characteristics of crystal edges were explained by the orientation of crystallites composing the replica films. It is proposed in the present study that the width of transparent edge of reprinted crystal might serve as a rough measure of microscopic magnification.