Characterization of nanostructures by reflection electron microscopy
作者:
A. Scherer,
B. P. Van der Gaag,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 25
页码: 2566-2568
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102867
出版商: AIP
数据来源: AIP
摘要:
We use reflection electron microscopy (REM) to analyze ion‐etched nanostructures defined in compound semiconductor heterostructures. This nondestructive imaging technique allows us to characterize 10‐nm‐wide features with high resolution and determine their sidewall morphology on a 1 nm scale. In addition to the inherent high‐resolution available from REM, we also obtain diffraction contrast from the heterostructure material, and we can image quantum wells. We routinely use this technique to characterize and accurately measure microfabricated structures with lateral dimensions below 20 nm.
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