Microwave Measurement of Mobility: Analysis of Apparatus
作者:
S. H. Liu,
Y. Nishina,
R. H. Good,
期刊:
Review of Scientific Instruments
(AIP Available online 1961)
卷期:
Volume 32,
issue 7
页码: 784-789
ISSN:0034-6748
年代: 1961
DOI:10.1063/1.1717508
出版商: AIP
数据来源: AIP
摘要:
The microwave mobility in a semiconductor can be obtained by mounting a sample in a bimodal cavity with an applied static magnetic field and then measuring the power transfer which is produced by the Faraday rotation in the sample. This paper gives an analysis of the effect based on the field distributions in the cavity and the wave propagation in the sample. The dependence of the power transfer on the static applied magnetic field, on the mobility and conductivity of the sample, and on an effective sample size is obtained.
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