X‐ray crystal truncation rod scattering measurement of AsH3‐exposed InP/InPAs/InP single heterostructures
作者:
Yoshikazu Takeda,
Yoshiyuki Sakuraba,
Kei Fujibayashi,
Masao Tabuchi,
Takayuki Kumamoto,
Isao Takahashi,
Jimpei Harada,
Hidenori Kamei,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 3
页码: 332-334
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114203
出版商: AIP
数据来源: AIP
摘要:
The atomic‐level heterointerface structures of InP samples that contain growth interrupted and AsH3‐exposed surface, with 20 A˚ thick cap layer, were revealed by x‐ray crystal truncation rod scattering measurement. The As atom distribution, the thickness of the cap layer, and the tetragonal distortion of the lattices were obtained from the samples that have only single modified layer in the whole InP wafer. The calculated total amounts of As matched well with the value obtained by fluorescence x‐ray analysis. ©1995 American Institute of Physics.
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