Andreev reflections at interfaces between &dgr;‐doped GaAs and superconducting Al films
作者:
R. Taboryski,
T. Clausen,
J. Bindslev Hansen,
J. L. Skov,
J. Kutchinsky,
C. B. So&slash;rensen,
P. E. Lindelof,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 5
页码: 656-658
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117796
出版商: AIP
数据来源: AIP
摘要:
By placing several Si &dgr;‐doped layers close to the surface of a GaAs molecular beam epitaxy–grown crystal, we achieve a compensation of the Schottky barrier and obtain a good Ohmic contact between aninsitudeposited (without breaking the vacuum) Al metallization layer and a highly modulation doped (n++) conduction layer embedded below the &dgr;‐doped layers in the GaAs crystal. When cooled to below the critical temperature (≊1.2 K) of Al, superconductivity is induced in the conductive layer of the semiconductor. We have studied the current voltage (I–V) characteristics in a planar geometry where the Al has been removed in a thin stripe. We find a manifestation of the superconducting energy gap and a rich fine structure at injection energies both below and above the gap. ©1996 American Institute of Physics.
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