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Andreev reflections at interfaces between &dgr;‐doped GaAs and superconducting Al films

 

作者: R. Taboryski,   T. Clausen,   J. Bindslev Hansen,   J. L. Skov,   J. Kutchinsky,   C. B. So&slash;rensen,   P. E. Lindelof,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 5  

页码: 656-658

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117796

 

出版商: AIP

 

数据来源: AIP

 

摘要:

By placing several Si &dgr;‐doped layers close to the surface of a GaAs molecular beam epitaxy–grown crystal, we achieve a compensation of the Schottky barrier and obtain a good Ohmic contact between aninsitudeposited (without breaking the vacuum) Al metallization layer and a highly modulation doped (n++) conduction layer embedded below the &dgr;‐doped layers in the GaAs crystal. When cooled to below the critical temperature (≊1.2 K) of Al, superconductivity is induced in the conductive layer of the semiconductor. We have studied the current voltage (I–V) characteristics in a planar geometry where the Al has been removed in a thin stripe. We find a manifestation of the superconducting energy gap and a rich fine structure at injection energies both below and above the gap. ©1996 American Institute of Physics.

 

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