X‐ray Talbot Interferometry (XTI) is demonstrated as a novel and simple X‐ray phase‐sensitive imaging method. Differential phase contrast is generated with XTI and quantitative determination of the differential phase is attained in combination with a phase‐shifting technique, further enabling phase tomography. Because XTI does not use crystals but transmission gratings, divergent X‐rays with a broad energy band are available. This is an advantage for medical applications especially using a compact X‐ray source. © 2004 American Institute of Physics