A high‐speed, high‐reliability, automatic diffractometer based on equi‐inclination geometry is described. Precomputed instructions are supplied on punched paper tape. The Miller indices of each reflection are recorded, both counter and initial crystal angles are set and recorded, the diffracted intensities at the required angular intervals in a fixed counter‐moving crystal stepwise scan are measured, and the final crystal angle is recorded automatically, all on punched paper tape. Angles are set to 0.01°. The output tape is processed to give the resulting corrected structure amplitudes on a common scale.