Simultaneous structure refinement of neutron, synchrotron and X‐ray powder diffraction patterns
作者:
J. K. Maichle,
J. Ihringer,
W. Prandl,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1988)
卷期:
Volume 21,
issue 1
页码: 22-28
ISSN:1600-5767
年代: 1988
DOI:10.1107/S0021889887008331
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
A technique has been developed for the simultaneous analysis of several powder diffraction data on the basis of the Rietveld method. Counting rates from one specimen at a given temperature taken at neutron, synchrotron or X‐ray powder diffractometers are joined to one single data set with weights given by the counting statistics. The structure is refined from this data set with a parameter field containing one structural model and individual zero points, scale factors and FWHM parameters for each of the methods and data sets. A new definition of the residuals is given. The residuals and goodness‐of‐fit values are calculated for all as well as for the individual data
点击下载:
PDF
(614KB)
返 回