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Thermoelectric power of thin silver films

 

作者: Ho‐Yuan Yu,   William F. Leonard,  

 

期刊: Journal of Applied Physics  （AIP Available online 1973）
卷期: Volume 44, issue 12  

页码: 5324-5327

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662151

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Measurements of thermoelectric power, resistivity, and the temperature coefficient of resistance have been made on annealed silver films. The values obtained for the energy dependence of the mean free path of conduction electrons, [(∂ ln&lgr;/∂ lnW)]W=WF, and the Fermi surface area, [(∂ lnA/∂ lnW)]W=WF, were 1.29 and −2.45, respectively.

 

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