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A High Resolution Mass Spectrometer for Atomic Mass Determinations

 

作者: R. C. Barber,   R. L. Bishop,   H. E. Duckworth,   J. O. Meredith,   F. C. G. Southon,   P. Van Rookhuyzen,   P. Williams,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1971）
卷期: Volume 42, issue 1  

页码: 1-8

 

ISSN:0034-6748

 

年代: 1971

 

DOI:10.1063/1.1684832

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A high resolution, second‐order double‐focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10−9, corresponding to ∼250 eV atM= 100 amu; typical precision is ∼5×10−9.

 

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