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A Class of Sequential Tests for an Exponential Parameter

 

作者: D.G. Hoel,   M. Mazumdar,  

 

期刊: Journal of the American Statistical Association  (Taylor Available online 1969)
卷期: Volume 64, issue 328  

页码: 1549-1559

 

ISSN:0162-1459

 

年代: 1969

 

DOI:10.1080/01621459.1969.10501076

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Weiss [5] and Freeman and Weiss [2] have shown how to construct sampling plans which at least approximately minimize the maximum expected sample size in the case of Bernoulli and Normal populations. In this paper we construct sequential procedures of this type for the testing of an exponential parameter. An invariance property of the stopping region is presented which simplifies the construction of the Bayes regions. Several sampling plans are given and some of their properties are obtained.

 

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