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Techniques for very low energy electron diffraction

 

作者: G. L. Price,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1980)
卷期: Volume 51, issue 5  

页码: 605-609

 

ISSN:0034-6748

 

年代: 1980

 

DOI:10.1063/1.1136262

 

出版商: AIP

 

数据来源: AIP

 

摘要:

LEED intensity curves between 0–50 eV contain sharp peaks due to electronic surface resonances. Successful comparison with theory requires an accurate knowledge of the incidence angles and energy resolution ≲0.15 eV. It is shown that these requirements can be achieved with a conventional LEED system. The resolution was obtained by doubly modulating the four grid retarding optics and the electron gun. The incidence angles were found with a simple photographic technique.

 

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