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Off-axis reflection zone plate for quantitative soft x-ray source characterization

 

作者: T. Wilhein,   D. Hambach,   B. Niemann,   M. Berglund,   L. Rymell,   H. M. Hertz,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 2  

页码: 190-192

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119497

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate &lgr;/&Dgr;&lgr;⩾1000 spectral resolution and absolute flux and brilliance measurements. ©1997 American Institute of Physics.

 

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