Off-axis reflection zone plate for quantitative soft x-ray source characterization
作者:
T. Wilhein,
D. Hambach,
B. Niemann,
M. Berglund,
L. Rymell,
H. M. Hertz,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 2
页码: 190-192
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119497
出版商: AIP
数据来源: AIP
摘要:
A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate &lgr;/&Dgr;&lgr;⩾1000 spectral resolution and absolute flux and brilliance measurements. ©1997 American Institute of Physics.
点击下载:
PDF
(57KB)
返 回