Photoconductivity of sputtered CuxS films
作者:
Paul S. McLeod,
Larry D. Partain,
Dave E. Sawyer,
Terry M. Peterson,
期刊:
Applied Physics Letters
(AIP Available online 1984)
卷期:
Volume 45,
issue 4
页码: 472-474
ISSN:0003-6951
年代: 1984
DOI:10.1063/1.95220
出版商: AIP
数据来源: AIP
摘要:
The optical band edge of reactively sputtered CuxS films has been determined to be 1.18±0.03 eV using a technique in which the conductance of the films with respect to the wavelength of the incident light was measured. These results were found to confirm optical absorption data on CuxS films. Also, the efficiency of a 6.0% solar cell which was made using this sputtering technique is reported.
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