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Photoconductivity of sputtered CuxS films

 

作者: Paul S. McLeod,   Larry D. Partain,   Dave E. Sawyer,   Terry M. Peterson,  

 

期刊: Applied Physics Letters  (AIP Available online 1984)
卷期: Volume 45, issue 4  

页码: 472-474

 

ISSN:0003-6951

 

年代: 1984

 

DOI:10.1063/1.95220

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The optical band edge of reactively sputtered CuxS films has been determined to be 1.18±0.03 eV using a technique in which the conductance of the films with respect to the wavelength of the incident light was measured. These results were found to confirm optical absorption data on CuxS films. Also, the efficiency of a 6.0% solar cell which was made using this sputtering technique is reported.

 

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