Trapping of Helium Ions and the Re‐Emission of Trapped Atoms from Molybdenum
作者:
L. J. Varnerin,
J. H. Carmichael,
期刊:
Journal of Applied Physics
(AIP Available online 1957)
卷期:
Volume 28,
issue 8
页码: 913-919
ISSN:0021-8979
年代: 1957
DOI:10.1063/1.1722887
出版商: AIP
数据来源: AIP
摘要:
The electrical cleanup of helium on molybdenum surfaces has been investigated. In this case, the phenomenon can be described by a trapping of ions upon impact with the surface. Measurements of the trapping efficiency &eegr; (atoms removed/ions collected) have been made over a range of ion energies from 150 to 2600 ev. The re‐emission of trapped helium atoms was investigated in detail. The contribution of re‐emission to the pumping process is described by a phenomenological theory. The results indicate that the trapping efficiency is lowered by a short time re‐emission of trapped atoms. Through the long‐time re‐emission of atoms, the theory accounts quantitatively for the observed saturation of the cleanup process.
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