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Models of diffraction from layered ultrathin coherent structures

 

作者: K. E. Meyer,   G. P. Felcher,   S. K. Sinha,   Ivan K. Schuller,  

 

期刊: Journal of Applied Physics  （AIP Available online 1981）
卷期: Volume 52, issue 11  

页码: 6608-6610

 

ISSN:0021-8979

 

年代: 1981

 

DOI:10.1063/1.328613

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We show how relatively simple diffraction theory can be applied to layered ultrathin coherent structures to yield diffraction patterns with main peaks and satellites. We also discuss how the introduction of lattice strain into the model affects the results, and how this modified model might be applied to a real system.

 

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