AbstractA number of approaches for graphically representing electron backscattered diffraction grain orientation measurements are presented, using as examples the distributions and variations of texture in two 8090 AI–Li alloys. In this manner the component orientations constituting the overall texture can be illustrated readily and their relative volume fractions calculated. The locations of texture components can be represented by texture distribution plots. The power of Mackenzian plots is illustrated by demonstrating their capacity to represent the degree of scatter about an ideal orientation, show differences in distribution that may be either real or due to specimen preparation, and highlight when two ideal orientations that are very close to each other, namely, {110}〈112〉and {110}〈335〉in this work, may be present.MST/3465