首页   按字顺浏览 期刊浏览 卷期浏览 Comments on ``Grain boundary contrast in field‐ion microscope images''. II
Comments on ``Grain boundary contrast in field‐ion microscope images''. II

 

作者: T. F. Page,   P. R. Howell,   B. Ralph,  

 

期刊: Journal of Applied Physics  (AIP Available online 1973)
卷期: Volume 44, issue 2  

页码: 902-906

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662285

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A recent paper by French and Bishop has discussed the field‐ion contrast from a particular grain boundary configuration as a function of increasing angular misorientation, the images being constructed by computer simulation. Although their boundary configuration was pure tilt about [110], the resulting surface contrast displays apparent tilt andtwistcharacter because of the oblique surface section of the emitter tip chosen to contain the boundary trace. The present paper aims to distinguish the contrast events occurring in such images as a function of this apparent tilt and twist character and to quantify the expected contrast in terms of the ``ring‐matching'' contrast theory proposed by the present authors.

 

点击下载:  PDF (395KB)



返 回