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Statics and dynamics of ferroelectric domains studied with scanning force microscopy

 

作者: R. Lüthi,   H. Haefke,   W. Gutmannsbauer,   E. Meyer,   L. Howald,   H.‐J. Güntherodt,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 4  

页码: 2451-2455

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587781

 

出版商: American Vacuum Society

 

关键词: FERROELECTRIC MATERIALS;TGS;DOMAIN STRUCTURE;IMAGES;MICROSCOPY;DYNAMICS;MORPHOLOGY;FORCES;ANNEALING;TGS;GASH

 

数据来源: AIP

 

摘要:

Scanning force microscopy for studying ferroelectric domain structures is applied. The force microscope was operated in the contact static mode (repulsive force regime) and in the noncontact dynamic mode (attractive force regime). These two techniques were applied to study cleavage faces of ferroelectric crystals of GASH (guanidinium aluminum sulfate hexahydrate) and TGS (triglycine sulfate) crystals. Using the contact mode, the positive and negative domains are revealed by opposite contrast. In the dynamic noncontact mode, the domain walls are revealed. The experimental setup allowsinsituexperiments to study the dynamics of ferroelectric domains. First results on the time dependence of the domains motion in TGS will be presented.

 

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