Digital integrator in scanning Auger electron microscopy
作者:
K. Goto,
S. Ichimura,
R. Shimizu,
期刊:
Review of Scientific Instruments
(AIP Available online 1980)
卷期:
Volume 51,
issue 1
页码: 95-97
ISSN:0034-6748
年代: 1980
DOI:10.1063/1.1136027
出版商: AIP
数据来源: AIP
摘要:
A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square‐wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
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