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Temperature Dependence of Electron Elastic Diffraction by Aluminum Films

 

作者: J. F. Graczyk,  

 

期刊: Journal of Applied Physics  (AIP Available online 1969)
卷期: Volume 40, issue 9  

页码: 3510-3514

 

ISSN:0021-8979

 

年代: 1969

 

DOI:10.1063/1.1658228

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The temperature dependence of elastic‐diffracted intensities for polycrystalline Al films has been investigated at 296° and 77°K as a function of crystal thickness in the range 600–2500 Å. A quantitative agreement is found with the predictions of the BJR two‐beam approximation of the dynamical theory. This agreement, however, appears to be best for Al in a range of thickness below the anomalous absorption distance or where kinematical theory should apply.

 

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