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Transmission electron microscopy of ⟨100⟩ dark line defects in CdZnSe quantum well structures

 

作者: G. D. U’Ren,   G. M. Haugen,   P. F. Baude,   M. A. Haase,   K. K. Law,   T. J. Miller,   B. J. Wu,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 26  

页码: 3862-3864

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115298

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The initial degradation of II–VI light emitting devices, namely the ⟨100⟩ dark line defect formation in CdZnSe quantum well structures formed during laser or light emitting diode (LED) operation, has been investigated. Optically degraded quantum well structures exhibiting dark line defects were investigated via transmission electron microscopy. The observable dislocation networks have been determined to be conglomerations of dislocation loops confined to the quantum well region having an associated Burgers vectors ofa[100] anda[010]. The discovery and identification of initial dark line defects may prove useful in identifying the defect mechanism in II–VI light emitters. ©1995 American Institute of Physics.

 

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