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Stability of low‐current break arcs between palladium contacts

 

作者: Eoin W. Gray,   Julian R. Pharney,  

 

期刊: Journal of Applied Physics  (AIP Available online 1973)
卷期: Volume 44, issue 5  

页码: 2124-2129

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662523

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The statistical distributions of break‐arc durations have been examined as functions of arc current and number of operations under both ``clean'' and contaminated conditions. Exponential distributions were found for arcs between clean palladium electrodes operating below 0.9 A. At higher currents a Gaussian‐ (normal) type distribution was observed. Under highly contaminated conditions the Gaussian distribution was observed at all current levels examined. These distributions have been discussed in terms of the ``ionic‐burst'' mechanism and thermionic emission. A model for the so‐called activation or arc‐duration enhancement of arcs is presented.

 

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