Stability of low‐current break arcs between palladium contacts
作者:
Eoin W. Gray,
Julian R. Pharney,
期刊:
Journal of Applied Physics
(AIP Available online 1973)
卷期:
Volume 44,
issue 5
页码: 2124-2129
ISSN:0021-8979
年代: 1973
DOI:10.1063/1.1662523
出版商: AIP
数据来源: AIP
摘要:
The statistical distributions of break‐arc durations have been examined as functions of arc current and number of operations under both ``clean'' and contaminated conditions. Exponential distributions were found for arcs between clean palladium electrodes operating below 0.9 A. At higher currents a Gaussian‐ (normal) type distribution was observed. Under highly contaminated conditions the Gaussian distribution was observed at all current levels examined. These distributions have been discussed in terms of the ``ionic‐burst'' mechanism and thermionic emission. A model for the so‐called activation or arc‐duration enhancement of arcs is presented.
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