Low temperature photo-oxidation of silicon using a xenon excimer lamp
作者:
Jun-Ying Zhang,
Ian W. Boyd,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 20
页码: 2964-2966
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120230
出版商: AIP
数据来源: AIP
摘要:
Low temperature (250 °C) photo-oxidation of silicon initiated by aXe2*excimer lamp operating at a wavelength of 172 nm has been investigated. The induced reaction rate of 0.1 nm/min is 90 times greater than thermal oxidation at 612 °C and more than three times greater than that previously obtained at 350 °C using a low pressure mercury lamp. It was found to be strongly dependent upon oxygen pressure with the highest rates being achievable below 10 mbar. Ellipsometry, Fourier transform infrared spectroscopy, capacitance–voltage, and current–voltage measurements have been employed to characterize the oxide films and designate them as high quality. ©1997 American Institute of Physics.
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