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Structural properties of the Na/Si(111)2×1 surface studied by photoemission extended x‐ray‐absorption fine structures

 

作者: P. S. Mangat,   P. Soukiassian,   Y. Huttel,   Z. Hurych,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 4  

页码: 2694-2698

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587233

 

出版商: American Vacuum Society

 

关键词: SODIUM;ABSORPTION;SILICON;INTERFACE STRUCTURE;ELECTRONIC STRUCTURE;PHOTOEMISSION;IONIC BONDS;COVALENT BONDS;Na;Si

 

数据来源: AIP

 

摘要:

We present a coverage dependent structural study of Na adsorption on the Si(111)2×1 surface by photoemission extended x‐ray‐absorption fine‐structure, core‐level, and valence‐band photo‐ emission spectroscopies using synchrotron radiation. In the submonolayer coverages, our results indicate the existence of two Na adsorption sites having a large difference in ionicity. Furthermore, a clear ionic to covalent transition is observed when completing the sodium monolayer saturation coverage, which corresponds to the alkali atom adsorbed on a threefold hollow site. These results indicate a very different behavior for the Na adsorption on Si(111)2×1 when compared to the Si(100)2×1 surface, where the Na–Si bond remains covalent in nature, even at low coverages.

 

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