Structural properties of the Na/Si(111)2×1 surface studied by photoemission extended x‐ray‐absorption fine structures
作者:
P. S. Mangat,
P. Soukiassian,
Y. Huttel,
Z. Hurych,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 4
页码: 2694-2698
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587233
出版商: American Vacuum Society
关键词: SODIUM;ABSORPTION;SILICON;INTERFACE STRUCTURE;ELECTRONIC STRUCTURE;PHOTOEMISSION;IONIC BONDS;COVALENT BONDS;Na;Si
数据来源: AIP
摘要:
We present a coverage dependent structural study of Na adsorption on the Si(111)2×1 surface by photoemission extended x‐ray‐absorption fine‐structure, core‐level, and valence‐band photo‐ emission spectroscopies using synchrotron radiation. In the submonolayer coverages, our results indicate the existence of two Na adsorption sites having a large difference in ionicity. Furthermore, a clear ionic to covalent transition is observed when completing the sodium monolayer saturation coverage, which corresponds to the alkali atom adsorbed on a threefold hollow site. These results indicate a very different behavior for the Na adsorption on Si(111)2×1 when compared to the Si(100)2×1 surface, where the Na–Si bond remains covalent in nature, even at low coverages.
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