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X‐ray photoelectron spectroscopy of (Fe,Co,Ni)‐SiO2granular films

 

作者: S. I. Shah,   K. M. Unruh,  

 

期刊: Applied Physics Letters  (AIP Available online 1991)
卷期: Volume 59, issue 26  

页码: 3485-3487

 

ISSN:0003-6951

 

年代: 1991

 

DOI:10.1063/1.105661

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Granular films of nominal composition (Fe,Co,Ni)50(SiO2)50were prepared by rf sputter deposition and characterized by transmission electron microscopy. In each case the films were found to consist of small metal particles, several nanometers in size, embedded in an amorphous silica matrix. The chemical composition of the metal particles was studied, for the first time, by x‐ray photoelectron spectroscopy. These measurements detected the presence of the metal oxides Fe3O4, FeO, Fe2O3, CoO, NiO, and Ni2O3associated with the Fe, Co, and Ni particles, respectively.

 

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