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X‐ray photoelectron spectroscopy of (Fe,Co,Ni)‐SiO2granular films
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X‐ray photoelectron spectroscopy of (Fe,Co,Ni)‐SiO2granular films
作者:
S. I. Shah,
K. M. Unruh,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 26
页码: 3485-3487
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105661
出版商: AIP
数据来源: AIP
摘要:
Granular films of nominal composition (Fe,Co,Ni)50(SiO2)50were prepared by rf sputter deposition and characterized by transmission electron microscopy. In each case the films were found to consist of small metal particles, several nanometers in size, embedded in an amorphous silica matrix. The chemical composition of the metal particles was studied, for the first time, by x‐ray photoelectron spectroscopy. These measurements detected the presence of the metal oxides Fe3O4, FeO, Fe2O3, CoO, NiO, and Ni2O3associated with the Fe, Co, and Ni particles, respectively.
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