Mn2O3by XPS

 

作者: Michael A. Stranick,  

 

期刊: Surface Science Spectra  (AIP Available online 1999)
卷期: Volume 6, issue 1  

页码: 39-46

 

ISSN:1055-5269

 

年代: 1999

 

DOI:10.1116/1.1247889

 

出版商: American Vacuum Society

 

关键词: XPS;manganese (III) oxide

 

数据来源: AIP

 

摘要:

Manganese compounds have many applications in areas such as catalysis, electrochemistry, and metallurgy, among others. Distinguishing between the various chemical states of manganese is an important aspect of research in many of these areas. It has been shown that the different chemical states of manganese can be identified with XPS through the Mn 2p3/2peak positions, Mn 2p1/2satellite–Mn 2p1/2peak separations, Mn 3smultiplet splittings, or Mn Auger parameters. To date, however, all of these values have not been available in a single reference. In this study, XPS has been used to obtain core level, Auger, and valence band spectra for a commercial, high purity Mn2O3powder. This submission provides a reference that contains all of the Mn XPS data necessary for the identification of Mn2O3and also provides information that may be useful for the analysis of other Mn compounds.

 

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