首页   按字顺浏览 期刊浏览 卷期浏览 Optical characterization of porous silicon embedded with CdSe nanoparticles
Optical characterization of porous silicon embedded with CdSe nanoparticles

 

作者: A. I. Belogorokhov,   L. I. Belogorokhova,   A. Pe´rez-Rodrı´guez,   J. R. Morante,   S. Gavrilov,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 19  

页码: 2766-2768

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122584

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Arrays of a few nanometer-size clusters have been realized using a porous silicon (PS) matrix by filling its pores with CdSe. The photoluminescence (PL) peak from the embedded area of the PS samples with different luminescence stabilizes at 1.79 eV. This has been interpreted as due to emission from the CdSe clusters with an average size of about 3–5 nm. Likewise, the PL and Raman scattering spectra of the pure PS area of the samples have been compared with those obtained from the embedded areas. PL spectra were examined as a function of laser irradiation. Finally, to analyze the possibility of the formation of metal/porous semiconductor contacts, cross-section structures have been observed by scanning electron microscopy in the electron-beam-induced current mode. ©1998 American Institute of Physics.

 

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