To obtain surface layer thickness easily, a simple pseudo pulse excited photoacoustic spectrometric method was proposed. An argon ion laser was chopped mechanically to generate a pseudo pulse (pulse width; 6.6 ms, duty 1.67%), which was then led to a sample enclosed in photoacoustic cell. Two layer samples made of polymethyl methacrylate (PMMA) were used as model samples. The photoacoustic signal waveform observed showed a maximum from the negative edge of the pseudo pulse of the laser. The delay of the signal increased concomitant with the sample surface thickness. The delay time of the signal was calculated by a cross-correlation method. A linear relationship was obtained between the delay time of the photoacoustic signal from the input pseudo pulse and the surface transparent layer thickness in the range of 0–90 mm. The regression line between the film thicknessx(cm) and the delay time was expressed with the thermal diffusivity of the film k, as follows; Δτ (s) = 1.16 × 10−1κ−½x+ 0.006. Using this result, the method proposed was successfully applied to the measurement of the thickness for laminated polyethylene film on papers. The method proposed is simple and easy to perform without any modification of usual photoacoustic instrumentation.