Filling of contacts and interconnects with Cu under XeCl excimer laser irradiation
作者:
Shi‐Qing Wang,
Edith Ong,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1992)
卷期:
Volume 10,
issue 1
页码: 160-165
ISSN:1071-1023
年代: 1992
DOI:10.1116/1.586290
出版商: American Vacuum Society
关键词: COPPER;EXCIMER LASERS;LASER BEAM MELTING;SPUTTERING;THIN FILMS;ELECTRIC CONTACTS;CONNECTORS;FILLERS;Cu
数据来源: AIP
摘要:
XeCl excimer laser (λ=308 nm) was used to melt and flow sputter deposited Cu film into contacts and trenches of different depths to fill them and to achieve a planarized surface. The process windows (in terms of laser fluence at substrate temperatures of 20, 365, and 440 °C) for the planarization and complete fill were investigated. We found that it is possible to completely fill the contacts and trenches of 1 μm in width and 1 μm in depth with an appreciable process window. However, we were only able to fill these 1 μm wide contacts and trenches of 2 μm in depth at 440 °C. The results and other phenomena will be discussed.
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