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Filling of contacts and interconnects with Cu under XeCl excimer laser irradiation

 

作者: Shi‐Qing Wang,   Edith Ong,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1992)
卷期: Volume 10, issue 1  

页码: 160-165

 

ISSN:1071-1023

 

年代: 1992

 

DOI:10.1116/1.586290

 

出版商: American Vacuum Society

 

关键词: COPPER;EXCIMER LASERS;LASER BEAM MELTING;SPUTTERING;THIN FILMS;ELECTRIC CONTACTS;CONNECTORS;FILLERS;Cu

 

数据来源: AIP

 

摘要:

XeCl excimer laser (λ=308 nm) was used to melt and flow sputter deposited Cu film into contacts and trenches of different depths to fill them and to achieve a planarized surface. The process windows (in terms of laser fluence at substrate temperatures of 20, 365, and 440 °C) for the planarization and complete fill were investigated. We found that it is possible to completely fill the contacts and trenches of 1 μm in width and 1 μm in depth with an appreciable process window. However, we were only able to fill these 1 μm wide contacts and trenches of 2 μm in depth at 440 °C. The results and other phenomena will be discussed.

 

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