We present a simple method for complete determination of the x‐ray polarization state, using just one Bragg reflection from a single‐crystal analyzer. For the linear polarization componentsP1andP2, we show that the usual method of using a 90° Bragg reflection can be extended to using any Bragg reflection with 2&thgr;≠90°. For circular componentP3, we use the intensity modulation profile in an azimuthal rotation caused by the phase‐sensitive interference around a multiple‐beam Bragg reflection. The combination of the two measurements allows a straightforward complete determination of x‐ray polarization, including an unpolarized component, in a broad applicable energy range.