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ELECTRON‐HOLE GENERATION IN GaAs

 

作者: Esther M. Conwell,  

 

期刊: Applied Physics Letters  (AIP Available online 1966)
卷期: Volume 9, issue 10  

页码: 383-385

 

ISSN:0003-6951

 

年代: 1966

 

DOI:10.1063/1.1754621

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Experimental findings have been interpreted by Copeland as indicating that the multiplication rate &agr;(E) of carriers in GaAs has a narrow peak between 3 and 10 kV/cm. It is argued here that theory can account for a sizeable &agr; at these low fields, but that, rather than having a maximum and decreasing to zero again, &agr; will continue to rise. The proposed variation of &agr; appears to be more consistent with experimental results.

 

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