A near‐field optical microscope (NFOM) has been developed that combines the features of a near‐field optical microscope and an atomic force microscope. Improved control over tip‐sample separation has led to improved optical imaging and independent surface topography information. The tip oscillation is normal to the sample plane thereby reducing lateral forces—important for nonperturbative imaging of soft samples. Both topographic images and reflection near‐field optical images are presented which demonstrate the capability of the system. ©1996 American Institute of Physics.