Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip‐sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. ©1996 American Institute of Physics.