Sulfur diffusion and the interstitial contribution to arsenic self‐diffusion in GaAs
作者:
Masashi Uematsu,
Peter Werner,
Matthias Schultz,
Teh Y. Tan,
Ulrich M. Go¨sele,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 19
页码: 2863-2865
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114810
出版商: AIP
数据来源: AIP
摘要:
A quantitative determination of the contribution of As self‐interstitials to the As self‐diffusion coefficient in GaAs has been carried out. Values of the As self‐interstitial contributions are deduced from sulfur indiffusion profiles in GaAs, which are simulated based on the kick‐out mechanism. Furthermore, the relative contributions of As self‐interstitials and of As vacancies are discussed. ©1995 American Institute of Physics.
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