Easy and reproducible method for making sharp tips of Pt/Ir
作者:
J. Lindahl,
T. Takanen,
L. Montelius,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1998)
卷期:
Volume 16,
issue 6
页码: 3077-3081
ISSN:1071-1023
年代: 1998
DOI:10.1116/1.590445
出版商: American Vacuum Society
关键词: Pt;Ir
数据来源: AIP
摘要:
We have investigated a simple yet powerful method for making sharp scanning tunneling microscopy tips of Pt/Ir. It consists of three electrochemical polish/etch steps, not requiring any special micropolishing. The tips, as seen by high-resolution transmission electron microscopy, are sharper than 20 Å. Furthermore, they are smooth, without mini tips and covered with an oxide layer not much thicker than the native one (as seen from a freshly cut wire) when all three steps are applied.
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