Gas‐source molecular beam epitaxy growth of highly strained device quality InAsP/InP multiple quantum well structures
作者:
H. Q. Hou,
C. W. Tu,
S. N. G. Chu,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 58,
issue 25
页码: 2954-2956
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.104733
出版商: AIP
数据来源: AIP
摘要:
InAsxP1−x/InP strained multiple quantum wells with strain as high as 2.5% were grown by gas‐source molecular beam epitaxy. Successful control of the arsenic composition over a wide range was achieved by two different growth techniques. Structural and optical studies, such as high‐resolution x‐ray rocking curve, cross‐sectional transmission electron microscopy, photoluminescence, and absorption measurement, indicate that we have obtained high quality multiple quantum wells that are suitable for optoelectronic applications.
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