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Gas‐source molecular beam epitaxy growth of highly strained device quality InAsP/InP multiple quantum well structures

 

作者: H. Q. Hou,   C. W. Tu,   S. N. G. Chu,  

 

期刊: Applied Physics Letters  (AIP Available online 1991)
卷期: Volume 58, issue 25  

页码: 2954-2956

 

ISSN:0003-6951

 

年代: 1991

 

DOI:10.1063/1.104733

 

出版商: AIP

 

数据来源: AIP

 

摘要:

InAsxP1−x/InP strained multiple quantum wells with strain as high as 2.5% were grown by gas‐source molecular beam epitaxy. Successful control of the arsenic composition over a wide range was achieved by two different growth techniques. Structural and optical studies, such as high‐resolution x‐ray rocking curve, cross‐sectional transmission electron microscopy, photoluminescence, and absorption measurement, indicate that we have obtained high quality multiple quantum wells that are suitable for optoelectronic applications.

 

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