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Method for the Precise Determination of Orientation from Electron Diffraction Patterns

 

作者: S. S. Sheinin,  

 

期刊: Journal of Applied Physics  （AIP Available online 1965）
卷期: Volume 36, issue 10  

页码: 3267-3268

 

ISSN:0021-8979

 

年代: 1965

 

DOI:10.1063/1.1702963

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A method for the exact determination of orientation from electron diffraction patterns by diffracted beam intensity measurements is presented. The method is applicable to strain‐free specimens and results indicate that the accuracy obtained is considerably better than previous techniques.

 

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