In order to determine if any structural effects could be observed accompanying the angle of evaporation effects described at this meeting by Orlowski, Spicer, and Baer, electron diffraction patterns were compared from Ge films that had been evaporated on to parlodion substrates at normal and 45° incidence. It was observed that in all cases the second diffraction peak was weaker with respect to the first peak in the 45° films. This observation indicates that changing the angle of incidence during evaporation could either alter the orientation of some anisotropic structural entity or produce some true structural change.