This paper presents general transmission electron microscopy observations of polymeric sol-gel derived PZT(52/48) thin films that were heat treated in a conventional furnace for 1 hour at 700[ddot]C. Results from high resolution TEM, EDS and EELS are also included. The thin films revealed a complex microstructure with dispersed nanocrystalline PbO second phase, embedded porosity, local chemical inhomogeneities, and residual organics. Intricate ferroelectric domain configurations were observed in the thin film grains, which were found to be sensitive to continuous electron beam irradiation. Some artifacts intrinsic to transmission electron microscopy are outlined and their consequences discussed.