High‐speed circuit measurements using photoemission sampling
作者:
J. Bokor,
A. M. Johnson,
R. H. Storz,
W. M. Simpson,
期刊:
Applied Physics Letters
(AIP Available online 1986)
卷期:
Volume 49,
issue 4
页码: 226-228
ISSN:0003-6951
年代: 1986
DOI:10.1063/1.97179
出版商: AIP
数据来源: AIP
摘要:
High‐speed sampling of the voltage waveform on a microstrip transmission line is performed by exploiting the multiphoton photoelectric effect induced by a visible cw mode‐locked laser source. Energy analysis of the electrons emitted from the surface of the strip line is used to infer the emission point potential at the arrival time of the laser pulse. The technique may be applied to measure voltage waveforms on metallization lines of any integrated circuit or electronic device and is capable of picosecond time resolution and millivolt sensitivity.
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