Capacitance–voltage measurement and modeling on a nanometer scale by scanningC–Vmicroscopy
作者:
Y. Huang,
C. C. Williams,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 1
页码: 369-372
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587127
出版商: American Vacuum Society
关键词: CV CHARACTERISTIC;DOPING PROFILES;SILICON;WAFERS;ATOMIC FORCE MICROSCOPY;VLSI;Si
数据来源: AIP
摘要:
Presently, a nanometer scale capacitance–voltage (C–V) method for the quantitative measurement of the lateral dopant distribution near a semiconductor surface is being established. An atomic force microscope is used to position a nanometer scale tip at a semiconductor surface, and localC–Vmeasurements are performed. ExperimentalC–Vcurves have been performed with tips of sub‐50 nm radius on a series of silicon wafers of known dopant density. It is shown that repeatableC–Vmeasurements can be performed with nanometer scale tips, and that the capacitance change from accumulation to depletion varies monotonically with local dopant density. TheC–Vmeasurements are compared with the theoretical predictions of a simple analytical model. The experimental measurements will be described and the results will be discussed.
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