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Thermal scanning ac susceptometry method for high‐Tcsuperconductor studies

 

作者: A. C. Bo´di,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1993)
卷期: Volume 64, issue 10  

页码: 2926-2929

 

ISSN:0034-6748

 

年代: 1993

 

DOI:10.1063/1.1144384

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Conventional ac susceptibility measurements and the conditions used in thermal analysis methods have been combined for normal‐superconductor transition studies. Accordingly, during the ac susceptibility measurements, the Y‐based sample is exposed to a temperature gradient. By controlling this gradient, the boundary between normal and superconducting region can be swept slowly at will across the specimen. The extended thermal scanning assures a high resolution to the new method. The observed fine details (even discontinuities) of the susceptibility spectra demonstrate its performance and basis.

 

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