Measurement of lifetime of photoinjected carriers in solar cells by reverse voltage pulse response
作者:
S.R.Dhariwal,
期刊:
IEE Proceedings I (Solid-State and Electron Devices)
(IET Available online 1980)
卷期:
Volume 127,
issue 1
页码: 20-24
年代: 1980
DOI:10.1049/ip-i-1.1980.0004
出版商: IEE
数据来源: IET
摘要:
Transient response ofp-njunction solar cells under constant illumination is studied by applying a reverse voltage pulse. It is shown that, by a proper choice of current in the external circuit, results similar to those in open-circuit voltage-decay method or reverse-voltage recovery method could be obtained. Thus an extremely simple circuit allows lifetime determination by keeping the cell under normal illuminated conditions.
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