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Measurement of lifetime of photoinjected carriers in solar cells by reverse voltage pulse response

 

作者: S.R.Dhariwal,  

 

期刊: IEE Proceedings I (Solid-State and Electron Devices)  (IET Available online 1980)
卷期: Volume 127, issue 1  

页码: 20-24

 

年代: 1980

 

DOI:10.1049/ip-i-1.1980.0004

 

出版商: IEE

 

数据来源: IET

 

摘要:

Transient response ofp-njunction solar cells under constant illumination is studied by applying a reverse voltage pulse. It is shown that, by a proper choice of current in the external circuit, results similar to those in open-circuit voltage-decay method or reverse-voltage recovery method could be obtained. Thus an extremely simple circuit allows lifetime determination by keeping the cell under normal illuminated conditions.

 

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