Spectrometer for high resolution resonant inelastic x‐ray scatteringa)
作者:
W. Schu¨lke,
A. Kaprolat,
Th. Fischer,
K. Ho¨ppner,
F. Wohlert,
期刊:
Review of Scientific Instruments
(AIP Available online 1995)
卷期:
Volume 66,
issue 3
页码: 2446-2452
ISSN:0034-6748
年代: 1995
DOI:10.1063/1.1145642
出版商: AIP
数据来源: AIP
摘要:
The requirements on the radiation source, the monochromator/mirror, the diffractometer, and the crystal dispersive analyzer for an optimum instrumentation dedicated to high resolution resonant inelastic scattering experiments are formulated. The possibility for the application of dispersion compensation is stressed. A provisional instrumentation at the HARWI–Compton beamline is described and test measurements of the resonant inelastic scattering cross section of Cu for incident photon energies scanning across theKthreshold and for scattered photon energies near theK&agr;1line are reported. By means of model calculation the important role of correct absorption correction of resonant inelastic scattering data is emphasized. ©1995 American Institute of Physics.
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