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Modified crossed‐beam apparatus for charge‐transfer cross section measurement

 

作者: M. Hashida,   S. Sakabe,   Y. Izawa,   S. Nakai,   C. Yamanaka,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 4  

页码: 877-881

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144915

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A modified crossed‐beam apparatus to measure charge‐transfer cross sections of metallic elements in wide impact‐energy range (10–1000 eV) has been developed. The ion optics to extract charge‐transferred ions from the primary neutral atomic beam was improved, and the background noise due to the collisions on residual gas and the charged particles produced by scattered laser light was reduced, and as the result, the S/N ratio of the charge‐transferred ion signal was significantly improved to be ≳100 at 10 eV impact energy. The reduction of primary ions extracted from the ion source in the atomic beam at low impact energy was compensated for by the improvement of the S/N ratio, and the impact energy for which the cross section can be measured was extended to a lower energy (∼10 eV).

 

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